Uncertainty in testing of open circuit supply faults in CMOS logic circuits
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Published
1996-11-30
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1.
Popa R, Cruceru C, Iliev M. Uncertainty in testing of open circuit supply faults in CMOS logic circuits. The Annals of “Dunarea de Jos“ University of Galati. Fascicle III, Electrotechnics, Electronics, Automatic Control, Informatics [Internet]. 30Nov.1996 [cited 2May2025];19:44-7. Available from: https://www.gup.ugal.ro/ugaljournals/index.php/eeaci/article/view/853
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