Uncertainty in testing of open circuit supply faults in CMOS logic circuits

  • Rustem Popa “Dunarea de Jos” University of Galati
  • Constantin Cruceru “Dunarea de Jos” University of Galati
  • Mircea Iliev “Dunarea de Jos” University of Galati

Abstract

Abstract and full text available only in printed form

Published
1996-11-30
How to Cite
1.
Popa R, Cruceru C, Iliev M. Uncertainty in testing of open circuit supply faults in CMOS logic circuits. The Annals of “Dunarea de Jos“ University of Galati. Fascicle III, Electrotechnics, Electronics, Automatic Control, Informatics [Internet]. 30Nov.1996 [cited 17May2024];19:44-7. Available from: https://www.gup.ugal.ro/ugaljournals/index.php/eeaci/article/view/853
Issue
Vol 19 (1996)
Section
Articles

@ "Dunarea de Jos" University of Galati

Most read articles by the same author(s)

Obs.: This plugin requires at least one statistics/report plugin to be enabled. If your statistics plugins provide more than one metric then please also select a main metric on the admin's site settings page and/or on the journal manager's settings pages.