Preparation and Characterization of Tin Oxide Thin Films
Keywords:
thermal evaporation, tin oxide, TEM, optical properties
Abstract
Tin oxide (SnO) thin films were prepared onto glass substrates by thermal evaporation under vacuum. The substrate temperature was kept constant at 300 K during the film growth. The structural studies using transmission electron microscopy (TEM) analysis showed that the SnO thin films have a polycrystalline and tetragonal crystal structure with preferential orientation of (110) planes parallel to the substrate. Optical transmission and reflection spectra, at normal incidence, in the spectral range 300-1100 nm, are investigated. The optical properties of SnO thin films were determined. The optical energy band gap, Eg, has been estimated from the absorption coefficient values using Tauc’s procedure. It is found that the SnO thin films exhibit direct band gap.
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[13]. K. L. Chopra - Thin Film Phenomena, McGraw-Hill, New York Book Co. 101, (1969).
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[15]. Y. Liu, Y. Dong, G. Wang - Appl. Phys. Lett. 82(2), 260, (2003).
[16]. N. Tigau, V. Ciupina, G. Prodan, G.I. Rusu, E. Vasile - J. Cryst. Growth 269, 392, (2004).
[17]. M. Huang, Y. Wang, Y. Austin Chang, Thin Solid Films 449, 113, (2004).
[18]. F. Aousgi, M. Kanzari - Energy Procedia 10, 313, (2011).
[19]. G.I. Rusu, M.E. Popa, G.G. Rusu, Iulia N. Salahoru - Appl. Surf. Sci. 218, 213, (2003).
[20]. T. S. Moss, M. Balkanski, (eds) - Handbook on Semiconductors, Optical Properties of Semiconductors, NorthHolland, Elsevier, Amsterdam, (1994).
[21]. N.F. Mott, E.A. Davis - Electronic Processes in NonCrystalline Materials, Clarendon Press, Oxford, (1971).
[22]. N. Tigau, V. Ciupina, G. Prodan - J. Cryst. Growth 277, 529, (2005).
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Published
2013-06-15
How to Cite
1.
TIGAU N, VLADU RADU DC, PRODAN G, GHEORGHIES C, CONDURACHE-BOTA S. Preparation and Characterization of Tin Oxide Thin Films. The Annals of “Dunarea de Jos” University of Galati. Fascicle IX, Metallurgy and Materials Science [Internet]. 15Jun.2013 [cited 2May2024];36(2):22-5. Available from: https://www.gup.ugal.ro/ugaljournals/index.php/mms/article/view/2834
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